Optical Resolution Reflectometers

Our Optical Frequency Domain Reflectometers (OFDR) provide micrometer-level resolution for the precise characterization of optical waveguides, such as optical fibers. Designed for both reflection and transmission measurements, our instruments offer comprehensive performance analysis in both the frequency and time domains.

Key Features:

· Ultra-High Resolution: Micrometer-scale precision for detailed waveguide characterization.
· Broad Measurement Capabilities: Measures insertion loss (IL), return loss (RL), group delay, chromatic dispersion (CD), polarization-dependent loss (PDL), 
and full transmission properties.
· Dual-Mode Operation: Works in both reflection and transmission for complete optical analysis
· Frequency & Time Domain Analysis: Enables in-depth diagnostics of optical components.
· Advanced Signal Processing: High dynamic range and accuracy for demanding applications.

Our OFDR solutions deliver unmatched accuracy and versatility, making them the ideal choice for optical component testing, research, and industrial applications.

Products :

· OBR4600 series : Optical Backscatter Reflectometer
· OBR6200 series : Portable Optical Backscatter Reflectometer
· LWA7000 series : Lightwave Component Analyzer
· OVA5100 series : Optical Vector Analyzer